Title:
半導体集積回路およびその動作方法
Document Type and Number:
Japanese Patent JP6776725
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To easily check the state of a resistance change element.SOLUTION: A semiconductor integrated circuit includes a crossbar switch circuit, and a determination circuit 102 which measures the electric potential of a data output side wiring of a reconfigurable circuit including the crossbar switch circuit, compares the measured electric potential with a predetermined electric potential threshold, and, on the basis of the result of the comparison, determines a failure of the crossbar switch circuit targeted in the reconfigurable circuit.SELECTED DRAWING: Figure 23
Inventors:
Yukihide Tsuji
Toshiji Sakamoto
Miyamura Shin
Nehashi Ryusuke
Ayuka Tada
White Asahi
Toshiji Sakamoto
Miyamura Shin
Nehashi Ryusuke
Ayuka Tada
White Asahi
Application Number:
JP2016163563A
Publication Date:
October 28, 2020
Filing Date:
August 24, 2016
Export Citation:
Assignee:
NEC
International Classes:
H03K19/177; G11C13/00; H01L21/8239; H01L27/105; H01L45/00; H01L49/00
Domestic Patent References:
| JP2014199705A | ||||
| JP2013213715A |
Foreign References:
| WO2012117467A1 | ||||
| WO2011158887A1 | ||||
| WO2013018281A1 |
Attorney, Agent or Firm:
Akio Miyazaki
Masaaki Ogata
Masaaki Ogata