Title:
SEMICONDUCTOR LIGHT EMITTING ELEMENT AND METHOD FOR MANUFACTURING SEMICONDUCTOR LIGHT EMITTING ELEMENT
Document Type and Number:
Japanese Patent JP2023020627
Kind Code:
A
Abstract:
To improve the reliability of semiconductor light emitting elements.SOLUTION: A semiconductor light emitting element 10 has an n-type semiconductor layer 24 comprising an n-type AlGaN-based semiconductor material, an active layer 26 on the n-type semiconductor layer 24 and comprising an AlGaN-based semiconductor material, a p-type semiconductor layer 28 on the active layer 26, a p-side contact electrode 30 including an Rh layer contacting with the top surface 28a of the p-type semiconductor layer 28, a p-side electrode coating layer 32 including a Ti layer, an Rh layer, and a TiN layer, which are in contact with the top surface 30a and the side surface 30b of the p-side contact electrode 30 and stacked in order, a dielectric coating layer having a connection aperture provided on the p-side electrode coating layer 32 and covering the p-side electrode coating layer 32 at a location different from the connection aperture; and a p-side current diffusion layer 40 which is connected to the p-side electrode coating layer 32 at the connection aperture.SELECTED DRAWING: Figure 1
Inventors:
NIWA NORITAKA
INAZU TETSUHIKO
AIDA HARUHISA
INAZU TETSUHIKO
AIDA HARUHISA
Application Number:
JP2021126105A
Publication Date:
February 09, 2023
Filing Date:
July 30, 2021
Export Citation:
Assignee:
NIKKISO CO LTD
International Classes:
H01L33/32; H01L21/28; H01L21/285; H01L33/40
Domestic Patent References:
JP6867536B1 | 2021-04-28 | |||
JP2018142687A | 2018-09-13 | |||
JP2021072376A | 2021-05-06 | |||
JP2019079982A | 2019-05-23 | |||
JP2007158132A | 2007-06-21 | |||
JP2021034473A | 2021-03-01 | |||
JPH09205179A | 1997-08-05 |
Foreign References:
WO2014068965A1 | 2014-05-08 | |||
WO2010125810A1 | 2010-11-04 | |||
WO2011077748A1 | 2011-06-30 | |||
US20180212109A1 | 2018-07-26 |
Attorney, Agent or Firm:
Morishita Kenki
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