To provide a semiconductor memory device having a function for facilitating discrimination of a resistance value of a resistance element in a reference cell.
A plurality of resistance measurement reference amplifiers RA0 to RA7 which are applied to a semiconductor memory device detecting a stored data by comparing voltage in accordance with stored data of a selected memory cell with voltage in accordance with the reference cell, and which are connected respectively to resistance elements of which the resistance values are different are provided, during test mode operation, voltage Vrar in accordance with the reference cell is compared with each of voltage Vra0 to Vra7 from the plurality of resistance measurement reference amplifiers, and a plurality of compared results are output from data input/output terminals DQ0 to DQ7.
Shuichi Fukuda
Takashi Sasaki