Title:
Semiconductor memory device
Document Type and Number:
Japanese Patent JP6152999
Kind Code:
B2
More Like This:
WO/1998/029811 | TIME-DISTRIBUTED ECC SCRUBBING TO CORRECT MEMORY ERRORS |
JPH0683718 | FAULT DETECTING CIRCUIT |
Inventors:
Tamura Mitsuru
Application Number:
JP2012178340A
Publication Date:
June 28, 2017
Filing Date:
August 10, 2012
Export Citation:
Assignee:
Mega Chips Co., Ltd.
International Classes:
G06F11/10; G06F12/16
Domestic Patent References:
JP10097475A | ||||
JP2001084002A | ||||
JP2008262614A | ||||
JP2009521049A | ||||
JP2008276492A | ||||
JP2002169729A | ||||
JP2006277395A | ||||
JP2011059866A |
Foreign References:
WO2008139689A1 |
Attorney, Agent or Firm:
Kengo Takao