Title:
SEMICONDUCTOR TESTER AND ITS TESTING METHOD
Document Type and Number:
Japanese Patent JP2005180946
Kind Code:
A
Abstract:
To provide a semiconductor tester and its testing method, for shortening test time by sharing wait time up to the stable operation of a plurality of devices.
This semiconductor tester has a procedure for setting conditions on a plurality of devices, a procedure for synchronizing wait time until the devices stably respond, a procedure for measuring the plurality of devices, and a procedure for determining the plurality of devices. This tester is structured so that time for waiting for responses is synchronized when measuring the plurality of device. This makes it possible to shorten test time and to shorten a development tome period for a measurement program.
Inventors:
YAMANAKA SHIGEO
Application Number:
JP2003417844A
Publication Date:
July 07, 2005
Filing Date:
December 16, 2003
Export Citation:
Assignee:
MATSUSHITA ELECTRIC IND CO LTD
International Classes:
G01R31/28; (IPC1-7): G01R31/28
Attorney, Agent or Firm:
Fumio Iwahashi
Tomoyasu Sakaguchi
Hiroki Naito
Tomoyasu Sakaguchi
Hiroki Naito
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