To provide a semiconductor tester capable of testing by setting different voltages at the same pin number of a plurality of tested devices to be simultaneously tested.

This semiconductor tester is provided with a plurality of storage means for storing preset voltage data, and a plurality of switching means capable of independently switching test signals of a driver output and a DC measuring device arbitrarily, thereby testing a plurality of tested devices at the same time. The tester includes a plurality of AND gates for receiving the preset voltage data to be stored in the storage means at one end and receiving the control signal at the other end, and outputting the AND thereof to the storage means, where by pins having the same number of the plurality of tested devices are simultaneously tested at different voltages.