To provide a semiconductor testing apparatus that reduces a maximum matching time, improves the overall efficiency of a test, and reduces a cost.

The semiconductor testing apparatus 100 measures a matching time for each block and for each of a plurality of DUTs 90 that output test signals and calculates an optimal maximum match time for matching is obtained in a predetermined amount of blocks for each of the DUTs 90 in a predetermined number-th function test out of a plurality of number of times of tests. The optimal maximum match time for each of the DUTs 90 are compared to detect a maximum value (a longest period in the optimal maximum match time) and the maximum value is set as a maximum matching time.