To provide a semiconductor testing system capable of saving the trouble of collecting input-output waveforms and fail information from semiconductor devices.

A semiconductor testing system has: a semiconductor testing apparatus 1 for executing a predetermined test on a semiconductor device 11a; and a control apparatus 2 for setting testing conditions and instructing the semiconductor testing apparatus 1 to execute the test. The control apparatus 2 includes: a capture section 20 serving as test data collecting means for collecting first data obtained by testing condition setting means for setting the testing conditions and execution instruction means for giving instructions for executing the test; and a converter section 21 serving as converting means by which the first data thus collected is converted into second data low in redundancy.