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Patent Searching and Data


Title:
SEMICONDUCTOR TESTING SYSTEM
Document Type and Number:
Japanese Patent JP2011226981
Kind Code:
A
Abstract:

To provide a semiconductor testing system capable of keeping confidentiality of test programs and test data.

A semiconductor testing system tests a target device on the basis of a test program and manages test data obtained from the test. The system includes: a semiconductor testing device which decrypts an encrypted test program with the use of a password, conducts a test on the target device on the basis of the decrypted test program, and encrypts and transmits test data obtained from the test with the use of a password; and a mass-produced server which issues passwords, encrypts a test program with the use of a password, transmits the encrypted test program to the semiconductor testing device, and decrypts encrypted test data received from the semiconductor testing device with the use of a password.


Inventors:
MOTOOKA RYUTA
Application Number:
JP2010098709A
Publication Date:
November 10, 2011
Filing Date:
April 22, 2010
Export Citation:
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Assignee:
YOKOGAWA ELECTRIC CORP
International Classes:
G01R31/28