Title:
SENSOR IMPROVEMENT
Document Type and Number:
Japanese Patent JP2017021042
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide an apparatus for monitoring a microstructure of a metal target, and an apparatus for calibrating electromagnetic sensors.SOLUTION: An electromagnetic sensor (400) for detecting a microstructure of a metal target comprises: a magnetic device (410, 420) for providing an excitation magnetic field; a magnetometer (430) for detecting a resultant magnetic field induced in the metal target; and a calibration circuit (450) for generating a calibration magnetic field for calibrating the electromagnetic sensor. The calibration reference magnetic field is generated by an electrical current induced in the calibration circuit (450) by the excitation magnetic field.SELECTED DRAWING: Figure 4
Inventors:
ANTHONY JOSEPH PEYTON
YIN WULIANG
STEPHEN JOHN DICKINSON
YIN WULIANG
STEPHEN JOHN DICKINSON
Application Number:
JP2016179316A
Publication Date:
January 26, 2017
Filing Date:
September 14, 2016
Export Citation:
Assignee:
UNIV MANCHESTER
International Classes:
G01N27/72
Domestic Patent References:
| JPS6017350A | 1985-01-29 | |||
| JPS50104754A | 1975-08-19 | |||
| JPS55155265A | 1980-12-03 |
Foreign References:
| GB1501751A | 1978-02-22 |
Other References:
DICKINSON ET AL.: "The Development of a Multifrequency Electromagnetic Instrument for Monitoring the Phase Transformati", IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, vol. 56, no. 3, JPN6018024423, June 2007 (2007-06-01), pages 879-886
Attorney, Agent or Firm:
Shoichi Okuyama
Arihara Koichi
Matsushima Tetsuo
Hidefumi Kawamura
Ayako Nakamura
Satoshi Morimoto
Yu Tanaka
Tokumoto Koichi
Akiko Mizushima
Arihara Koichi
Matsushima Tetsuo
Hidefumi Kawamura
Ayako Nakamura
Satoshi Morimoto
Yu Tanaka
Tokumoto Koichi
Akiko Mizushima