Title:
対象物の非破壊特徴付けのためのセンサー
Document Type and Number:
Japanese Patent JP6778257
Kind Code:
B2
Abstract:
The present invention relates to a millimeter or terahertz wave sensor for providing inline inspection, preferably including but not limited to continuous monitoring of objects, for example thin sheet dielectric material.
Inventors:
Noel Deferm
Tom Redant
Wim Dehane
Patrick Reynard
Tom Redant
Wim Dehane
Patrick Reynard
Application Number:
JP2018516635A
Publication Date:
October 28, 2020
Filing Date:
June 13, 2016
Export Citation:
Assignee:
Hammer-IMS
International Classes:
G01N22/00; G01N21/3581
Domestic Patent References:
| JP2003014658A | ||||
| JP5113412A | ||||
| JP2007528585A | ||||
| JP11132968A | ||||
| JP63200155U |
Foreign References:
| WO2007145143A1 | ||||
| US20090052764 |
Attorney, Agent or Firm:
Samejima Mutsumi
Haruo Nakano
Mikio Takeuchi
Haruo Nakano
Mikio Takeuchi