Title:
SHEET FOR THREE-DIMENSIONAL EXAMINATION DIAGNOSIS, DEVICE FOR THREE-DIMENSIONAL EXAMINATION DIAGNOSIS, METHOD OF MANUFACTURING SHEET FOR THREE-DIMENSIONAL EXAMINATION DIAGNOSIS, AND EXAMINATION DIAGNOSIS METHOD
Document Type and Number:
Japanese Patent JP2014126484
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a sheet for three-dimensional examination diagnosis which is superior in mass-productivity and high in flexibility.SOLUTION: There is provided a sheet for three-dimensional examination diagnosis including: a sheet type base material 10; a flow passage part 14 formed at at least a part of one surface of one end part of the base material 10 and including a plurality of flow passage parts 14a branching off from one injection part 15 and independent flow passage parts 14b as many as the branching flow passage parts 14a; a both-sided tape 12a formed at at least a part of one surface of an intermediate part of the base material 10; a both-sided tape 12b formed at at least a part of the other surface; a plurality of opening parts 19, 20a, 20b, 22a, 22b, 24a, 24b, 26a, and 26b formed at the intermediate part and penetrating the both-sided tape 12a, base material 10, and both-sided tape 12b; and a sample injection hole 18 formed at the other end part of the base material 10 and penetrating the base material 10.
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Inventors:
NOJI SUMIHARU
JIN QING-RI
MIYAWAKI KATSUYUKI
SASAKI HIROYUKI
HIRATA KAZUHIRO
SATO YASUO
HIRAISHI YOSHIYUKI
MITSUMORI MASAYUKI
JIN QING-RI
MIYAWAKI KATSUYUKI
SASAKI HIROYUKI
HIRATA KAZUHIRO
SATO YASUO
HIRAISHI YOSHIYUKI
MITSUMORI MASAYUKI
Application Number:
JP2012284231A
Publication Date:
July 07, 2014
Filing Date:
December 27, 2012
Export Citation:
Assignee:
UNIV TOKUSHIMA
KURAMOTO SANGYO KK
HITACHI ALOKA MEDICAL LTD
KURAMOTO SANGYO KK
HITACHI ALOKA MEDICAL LTD
International Classes:
G01N33/543
Domestic Patent References:
JP2012105721A | 2012-06-07 | |||
JPH11502018A | 1999-02-16 | |||
JPH1194819A | 1999-04-09 |
Foreign References:
US20050196318A1 | 2005-09-08 |
Attorney, Agent or Firm:
Patent Corporation yki International Patent Office
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