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Title:
SHUTTER TIME LAG MEASUREMENT METHOD, SHUTTER TIME LAG MEASUREMENT DISPLAY DEVICE, SHUTTER TIME LAG MEASUREMENT DEVICE, AND MANUFACTURING METHOD OF CAMERA
Document Type and Number:
Japanese Patent JP2014077948
Kind Code:
A
Abstract:

To facilitate measurement of a shutter time lag of a camera.

In a display section having i display elements, when j display elements are caused to be in a first display state and (i-j) display elements are caused to be in a second display state which is darker than the first display state, the i display elements are caused to be a m-th display pattern. After a pattern continuation time TP has elapsed, in the m-th display pattern, k display elements in the j display elements in the first display state are caused to be in the second display state, and in the m-th display pattern, k display elements in (i-j) display elements which are in the second display state are caused to be in the first display state. Thus, a switching operation is sequentially executed to switch i display elements into a (m+1)-th display pattern. The camera takes images of the display section which is in execution of the switching operation in accordance with a shutter operation made on the camera synchronously with the switching operation. Thus, a shutter time lag is calculated based on the images taken by the camera.


Inventors:
SHIOBARA RYUICHI
Application Number:
JP2012226674A
Publication Date:
May 01, 2014
Filing Date:
October 12, 2012
Export Citation:
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Assignee:
SEIKO EPSON CORP
International Classes:
G03B7/091; G03B15/00; G03B17/02; G03B17/38; H04N5/222; H04N5/225
Domestic Patent References:
JP2010206520A2010-09-16
JP2002290979A2002-10-04
JP2010206520A2010-09-16
JP2002290979A2002-10-04
Foreign References:
US20080002029A12008-01-03
Attorney, Agent or Firm:
Masahiko Ueyanagi
Kazuhiko Miyasaka
Kazuaki Watanabe