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Title:
SIGHT LINE INFORMATION CORRECTION DEVICE, SIGHT LINE INFORMATION DETECTION DEVICE, SPECTACLE LENS DESIGN METHOD, SPECTACLE LENS MANUFACTURING METHOD, SPECTACLE LENS SELECTION DEVICE, SPECTACLE LENS METHOD, AND SPECTACLE LENS
Document Type and Number:
Japanese Patent JP2017037330
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To realize detection of further accurate sight line information.SOLUTION: A sight line information correction device 100 includes: an input unit to which sight line information obtained on the basis of a condition of an eyeball of a subject who wears an optical instrument that refracts light to enter the eyeball is input; and a calculation unit that corrects the sight line information input into the input unit using optical information relating to refraction of the light at the optical instrument.SELECTED DRAWING: Figure 1

Inventors:
MIZUNO MASATOMO
UNO DAISUKE
Application Number:
JP2016198156A
Publication Date:
February 16, 2017
Filing Date:
October 06, 2016
Export Citation:
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Assignee:
NIKON CORP
International Classes:
G02C13/00; A61B3/113
Domestic Patent References:
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Foreign References:
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Attorney, Agent or Firm:
Fuyuki Nagai
Takao Watanabe