Title:
SIGNAL ANALYZER
Document Type and Number:
Japanese Patent JP3433724
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To detect a desired part in a signal to be measured which needs a wide band for detection and at the same time collect the data of the desired part in a high dynamic range.
SOLUTION: An IF amplifier 14 respectively supplies an IF signal to 1st and 2nd signal paths. The ADC 16 of the 1st signal path digitizes the IF signal and generates 1st digital data. The 1st digital data has a high dynamic range even though its band is relatively narrow. In the 2nd signal path, an analog IQ splitter 15 separates an IQ from the IF signal, and ADCs 17 and 19 digitize an I signal and a Q signal respectively and generate 2nd digital data. Since the bands of an analog I signal and an analog Q signal are almost half compared with that of the IF signal, the generated 2nd digital signal can consequently obtain a wide band characteristic. An operation control circuit 22 specifies the desired part in the signal to be measured from the 2nd digital signal and specifies data corresponding to the desired part in the 1st digital data.
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Inventors:
Akira Nara
Application Number:
JP2000128499A
Publication Date:
August 04, 2003
Filing Date:
April 27, 2000
Export Citation:
Assignee:
Tektronix International Sales GmbH
International Classes:
G01R23/173; H04B17/00; H04B17/309; H04L27/14; (IPC1-7): H04B17/00; G01R23/173; H04L27/14
Domestic Patent References:
| JP10227816A | ||||
| JP2000151731A | ||||
| JP1010168A | ||||
| JP1151990A | ||||
| JP634679A |
Attorney, Agent or Firm:
Kunio Yamaguchi (2 outside)