SIGNAL FEEDER, ITS INSPECTING METHOD, SEMICONDUCTOR DEVICE USING IT, ELECTROOPTICAL DEVICE, AND ELECTRONIC APPARATUS

Japanese Patent JP3951560

B2

PROBLEM TO BE SOLVED: To solve a problem that the outputs of individual impedance converting circuits are measured in inspecting the performance of an impedance converting device on a plurality of impedance converting circuits for input voltages VIN, thus requiring a long time in the past.
SOLUTION: A signal feeder 10 impedance-converts the signals fed from D-A converters 12-1 through 12-N respectively with voltage followers 14-1 through 14-N and feeds them as outputs O1-ON. III an inspection mode, the signal feeder 10 switches switching elements 26-1 through 26-N respectively and short-circuits the output lines of the voltage followers 14-1 through 14-N via an output inspecting line 30. The current value measured at a short circuit is compared with a prescribed current value to judge the quality of the signal feeder 10.

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WO/2004/017215	SENSOR, CONTROLLER AND METHOD FOR MONITORING AT LEAST ONE SENSOR
JPS58201533	CHARGE CONTROL MICROCOMPUTER FOR VEHICLE

Akira Morita

JP2000178217A

August 01, 2007

June 14, 2000

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Seiko Epson Corporation

G01R31/00; G02F1/13; G09G3/00; H01L21/822; H01L27/04; G09G3/20; G09G3/36; (IPC1-7): G01R31/00; G02F1/13; H01L27/04; H01L21/822

JP63100766A
JP5096886U
JP2000131393A
JP9329799A

Inoue Ichi
Takekoshi Noboru
Enami Tomokazu
Yasushi Kuroda
Yukio Fuse
Mitsue Obuchi

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