Title:
SIGNAL TEST DEVICE
Document Type and Number:
Japanese Patent JP2014134538
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a signal test device.SOLUTION: A signal test device includes: a probe body; a probe column installed at one end of the probe body; a probe pin connected to the probe column and contacted with a signal end of a test object; a ground terminal connected to the probe body and contacted with a ground end of the test object; and a cable installed at the other end of the probe body and connected to an oscilloscope. One end of the probe pin is movably installed in the inside of the probe column, and in the inside of the probe column, a propulsion sheet connected to the probe pin through a first switch and a first interlocking rod electrically connected to a waveform capturing button of the oscilloscope is installed. When receiving pressing force, the probe pin moves toward the inside of the probe column. The interlocking rod and the propulsion sheet move toward the first switch with the probe pin to propel the first switch, thereby touching off the wave form capturing button of the oscilloscope to capture the wave forms of a test signal.
Inventors:
MA SONG
WU ZHOU
WU ZHOU
Application Number:
JP2013257972A
Publication Date:
July 24, 2014
Filing Date:
December 13, 2013
Export Citation:
Assignee:
KOFUKIN SEIMITSU KOGYO
HON HAI PREC IND CO LTD
HON HAI PREC IND CO LTD
International Classes:
G01R13/20; G01R1/067
Attorney, Agent or Firm:
Yasuhiko Murayama
Masatake Shiga
Takashi Watanabe
Shinya Mitsuhiro
Masatake Shiga
Takashi Watanabe
Shinya Mitsuhiro
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