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Title:
SILICON-ON-INSULATOR STRUCTURE AND MANUFACTURE THEREOF
Document Type and Number:
Japanese Patent JP3630401
Kind Code:
B2
Abstract:

PROBLEM TO BE SOLVED: To provide a planar silicon-on-insulator(SOI) structure and a method for manufacturing the structure.
SOLUTION: The SOI structure has a silicon wafer 10, an oxide layer 12 and a silicon layer 14. A trench is formed as extended from an upper surface of the structure to the silicon wafer, and the trench is filled with semiconductor 34. The trench has an upper part, a bottom surface and a sidewall. The sidewall has a sidewall silicon part. The sidewall silicon part of the trench sidewall is covered with a trench sidewall oxide layer 30. A protective sidewall 32 is formed on the trench sidewall and a trench sidewall oxide layer as extended from the upper part of the trench to the bottom surface of the trench.


Inventors:
Effendy Leo Bandung
Devenda Kay Sadana
Dominique jay shepis
Gavam Shahidi
Application Number:
JP2000035433A
Publication Date:
March 16, 2005
Filing Date:
February 14, 2000
Export Citation:
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Assignee:
INTERNATIONAL BUSINESS MASCHINES CORPORATION
International Classes:
H01L21/205; H01L21/76; H01L21/762; H01L27/12; (IPC1-7): H01L27/12; H01L21/205
Domestic Patent References:
JP8017694A
JP10041381A
JP6232246A
JP5343320A
JP8186165A
JP6334030A
JP11017001A
JP1117043A
JP1214047A
JP10092923A
Foreign References:
WO1994027317A1
Attorney, Agent or Firm:
Hiroshi Sakaguchi
Yoshihiro City