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Patent Searching and Data


Title:
SINE WAVE PHASE MEASUREMENT APPARATUS
Document Type and Number:
Japanese Patent JPH11160373
Kind Code:
A
Abstract:

To attain a highly accurate phase measurement after making resolution of A/D conversion uniform and reducing the resolution.

A to-be-measured sine wave signal is divided into two by a signal divider 10, and the phase of the second sine wave signal is controlled in the phase shift 12. After that, each amplitude of the first sine wave signal and the second sine wave signal is treated by each A/D converter 11, 14, and phase of the to-be-measured sine wave signal is calculated based upon each amplitude of the first and the second sine wave signals.


Inventors:
NAKAHARA TOMOO
Application Number:
JP32834297A
Publication Date:
June 18, 1999
Filing Date:
November 28, 1997
Export Citation:
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Assignee:
TOSHIBA CORP
International Classes:
G01R25/00; G01R25/04; G01S7/292; (IPC1-7): G01R25/00; G01R25/04; G01S7/292
Attorney, Agent or Firm:
Takehiko Suzue (6 outside)