Title:
SINGLE PARTICLE DETECTION DEVICE USING PHOTOMETRIC ANALYSIS, SINGLE PARTICLE DETECTION METHOD AND SINGLE PARTICLE DETECTION COMPUTER PROGRAM
Document Type and Number:
Japanese Patent JP2015083922
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To enable a single particle to be detected for each kind in a sample solution in which a single particle not emitting in a specific wavelength band of a plurality of kinds is mixed in single particle detection technologies by a scanning molecule counting method individually detecting a single particle using an optical measurement by a confocal microscope or a multiphoton microscope.SOLUTION: A technology detecting a single particle in a sample solution according to the present invention is configured to: detect light of a specific wavelength band from a light detection area while moving a position of the light detection area of a microscope in a sample solution including a single particle of a plurality of kinds not emitting in a mutually different wavelength band, and generate light intensity data in time series; and individually detect fall-off in light intensity occurring when the single particle not emitting in the specific wavelength band in the time series light intensity data enters the light detection area as a signal showing respective existences of the single particle.
Inventors:
HANASHI TAKUYA
TANABE TETSUYA
YAMAGUCHI MITSUSHIRO
TANABE TETSUYA
YAMAGUCHI MITSUSHIRO
Application Number:
JP2012023699A
Publication Date:
April 30, 2015
Filing Date:
February 07, 2012
Export Citation:
Assignee:
OLYMPUS CORP
International Classes:
G01N21/64; G01N15/14; G02B21/00
Attorney, Agent or Firm:
Akashi Masatake
Kenichiro Akashi
Kenichiro Akashi