Title:
SLIT LAMP MICROSCOPE
Document Type and Number:
Japanese Patent JP2017121555
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a slit lamp microscope capable of controlling the irradiation state of slit light and the irradiation state of background illumination light to be linked to each other.SOLUTION: The slit lamp microscope comprises a main illumination system, a background illumination system, an observation system, a control part, and a storage part. The main illumination system includes a first light source part for outputting first light and a slit forming part for forming a width-variable slit, and illuminates a subject's eye with the first light having passed through the slit. The background illumination system includes a second light source part for outputting second light and illuminates a peripheral area of the illumination area of the first light to the subject's eye with the second light. The observation system guides reflection light of the first light and reflection light of the second light by the subject's eye to an ocular lens and an image pickup device. The storage part stores mapping information obtained by mapping the control contents of the slit forming part and the second light source part. The control part controls the slit forming part and the second light source part on the basis of the mapping information.SELECTED DRAWING: Figure 3
Inventors:
SATO TOSHIAKI
TAKEDA TAKANORI
WATANABE TAKAHIRO
TAKEDA TAKANORI
WATANABE TAKAHIRO
Application Number:
JP2017078829A
Publication Date:
July 13, 2017
Filing Date:
April 12, 2017
Export Citation:
Assignee:
TOPCON CORP
International Classes:
A61B3/135
Domestic Patent References:
| JPH0690905A | 1994-04-05 | |||
| JP2012228309A | 2012-11-22 | |||
| JP2012254197A | 2012-12-27 |
Foreign References:
| WO2012172907A1 | 2012-12-20 |
Attorney, Agent or Firm:
Enami Tomokazu
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