Title:
SOCKET FOR SPRING PROBE PIN
Document Type and Number:
Japanese Patent JPH01117280
Kind Code:
A
Abstract:
PURPOSE:To make testing of a large scale integrated circuit board safe and secure without causing short circuit accidents even if a spring probe pin is deformed and comes into contact with an adjacent socket while in use by covering a conductor having a hole for attaching the spring probe pin with an insulator. CONSTITUTION:A hole 10 for attaching a spring probe pin 4 is provided in a conductor 3 covered with an insulator 2. When using a socket 1 for the spring probe pin, two sockets 1, 1 for the spring probe pins are made to pass through a pin board 6 located below a printed circuit board 7 provided with an electronic component 8. The spring probe pin 4 is then attached to the hole 10 on each one end of the sockets 1, 1 while a wire 5 is connected to the each other end of the sockets. With this constitution, testing of a large scale integrated circuit board or the like can be performed safely and securely without causing the spring probe pin 4, even if it is deformed by a string force, to short- circuit to an adjacent socket.
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Inventors:
WATABE YUSUKE
Application Number:
JP27504487A
Publication Date:
May 10, 1989
Filing Date:
October 29, 1987
Export Citation:
Assignee:
NEC CORP
International Classes:
H01R13/03; G01R1/06; G01R1/067; (IPC1-7): G01R1/06; G01R1/067; H01R13/03
Attorney, Agent or Firm:
Ozeki Shinsuke