Title:
太陽電池の評価方法及び評価装置並びに太陽電池の評価用プログラム
Document Type and Number:
Japanese Patent JP6781985
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To achieve the optimization of a production process by conducting evaluation to identify, without destruction, a cause at a back side of a solar battery when designed performance is not obtained or the solar battery has failed.SOLUTION: If quantum efficiency measured by radiating excitation light with a spot size of 1 mm to one point on a light-receiving surface of a solar battery is lower than that of a reference sample at a prescribed wavelength, it is determined that its reason is due to an impact of back side structure (S1-S10). Then, the back side structure can be measured nearly without an influence of surface side structure by radiating, to the solar battery, excitation light of which the spot size is made equal to or more than twice width of a surface side electrode and close to minority carrier diffusion length as much as possible (S11, S13, S15-S21).SELECTED DRAWING: Figure 3
Inventors:
Mochizuki Toshimitsu
Katsuhiko Shirasawa
Isao Sakata
Hidenao Takato
Katsuhiko Shirasawa
Isao Sakata
Hidenao Takato
Application Number:
JP2016170095A
Publication Date:
November 11, 2020
Filing Date:
August 31, 2016
Export Citation:
Assignee:
National Institute of Advanced Industrial Science and Technology
International Classes:
H02S50/10; H01L21/66
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Foreign References:
| WO2013084441A1 | ||||
| US20130314118 |
Other References:
DENG, Weiwei et al.,20.8% Efficient PERC Solar Cell on 156 mm×156 mm p-Type Multi-Crystalline Silicon Substrate,2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC),IEEE,2015年12月17日,pp.1-6,DOI:10.1109/PVSC.2015.7356221,URL,https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7356221