Title:
太陽電池の検査装置および検査方法
Document Type and Number:
Japanese Patent JP7398097
Kind Code:
B2
Abstract:
To provide an inspection device and an inspection method of a solar cell that contribute to appropriate detection of a defect regarding a split groove of a rear electrode layer.SOLUTION: An inspection device comprises a measurement part F11. The measurement part measures a conduction state between a first type terminal pair TA contacting a first cell rear electrode layer adjacent to a first side part of a first split groove, a conduction state between a second type terminal pair TB contacting a second cell rear electrode layer adjacent to a second side part of the first split groove, and an insulation state between a third type terminal pair TC including one terminal T of the first type terminal pair and one terminal of the second type terminal pair.SELECTED DRAWING: Figure 11
Inventors:
Masami Takahashi
Application Number:
JP2019237300A
Publication Date:
December 14, 2023
Filing Date:
December 26, 2019
Export Citation:
Assignee:
Samsung Diamond Industry Co., Ltd.
International Classes:
H02S50/10; G01R31/26; H01L31/0463
Domestic Patent References:
| JP2011119695A | ||||
| JP2010199506A | ||||
| JP2012134373A | ||||
| JP2010236889A |
Foreign References:
| CN205880059U |
Attorney, Agent or Firm:
Koji Fukui