Title:
半田検査装置および半田検査方法
Document Type and Number:
Japanese Patent JP4549662
Kind Code:
B2
Inventors:
Masahiro Kihara
Takashi Katsuki
Takahiro Fukagawa
Takashi Katsuki
Takahiro Fukagawa
Application Number:
JP2003405393A
Publication Date:
September 22, 2010
Filing Date:
December 04, 2003
Export Citation:
Assignee:
Panasonic Corporation
International Classes:
B41F15/08; G01B11/24; B41F33/14; G01N21/956; H05K3/34
Domestic Patent References:
| JP11248639A | ||||
| JP526636A | ||||
| JP267949A |
Attorney, Agent or Firm:
Hiroki Naito
Daisuke Nagano
Kentaro Fujii
Daisuke Nagano
Kentaro Fujii