To solve the problem that a tester can not automatically evaluate an item about an output waveform in which a reset operation is imperfect since the behavior of an effective pixel period image signal level can not be detected even though the effective pixel period image signal level varies with respect to a shielded pixel period image signal level to be the reference level of the entire image signal while the reset operation of a solid-state imaging device is imperfect.
In this solid-state imaging device for calculating a difference between the output voltage of a floating diffusion part after applying a reset pulse signal to a reset gate in the signal charge output period period of a light receiving part corresponding to a light shielded area and the output voltage of the floating diffusion part after applying a reset pulse signal to the reset gate in the signal charge output period of the light receiving part corresponding to an area other than the shielded area, a reset operation characteristic is quantitatively evaluated by calculating a difference in a reset feed through part signal level between a light shielding area period image data signal and an effective pixel period image data signal after both of them are reset.
Tomoyasu Sakaguchi
Hiroki Naito