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Title:
宇宙環境試験装置
Document Type and Number:
Japanese Patent JP4266977
Kind Code:
B2
Abstract:

To provide a space environment testing device capable of rotating a temperature controlling plate, reducing occurrence of deficiency of a driving part due to temperature environment and facilitating maintenance.

This space environment testing device 1 is constituted by providing the temperature controlling plate 5 to fix a test piece 4 in a vacuum container 2, providing a rotation axis 6 to rotate the temperature controlling plate 5 penetrating the vacuum container 2 and providing a flexible piping 8 to supply and discharge a refrigerant 7 to and from the temperature controlling plate 5 wound around the rotation axis 6. Additionally, the driving part 30 to rotate and drive the temperature controlling plate 5 from the outside of the vacuum container 2 is provided with the rotation axis 6, and the flexible piping 8 is constituted so as to wind around the rotation axis 6 with rotation of the temperature controlling plate 5.

COPYRIGHT: (C)2007,JPO&INPIT


Inventors:
Masakazu Nagami
Nao Kitayama
Wataru Takahashi
Application Number:
JP2005335351A
Publication Date:
May 27, 2009
Filing Date:
November 21, 2005
Export Citation:
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Assignee:
Taiyo Nippon Sanso Co., Ltd.
International Classes:
B64G7/00; G01M99/00
Domestic Patent References:
JP2002107273A
JP2000065068A
JP11030572A
JP10260115A
JP4063277A
Attorney, Agent or Firm:
Masatake Shiga
Tadashi Takahashi
Takashi Watanabe
Masakazu Aoyama
Suzuki Mitsuyoshi
Kazuya Nishi
Yasuhiko Murayama