空間・分光波面分析測定方法及び装置 - Aikos Vision Systems Namrose Fennaught Shap

Title:

空間・分光波面分析測定方法及び装置

Document Type and Number:

Japanese Patent JP5537629

Kind Code:

B2

Abstract:

A method and apparatus for wavefront analysis including obtaining a plurality of differently phase changed transformed wavefronts corresponding to a wavefront being analyzed which has an amplitude and a phase, obtaining a plurality of intensity maps of the plurality of phase changed transformed wavefronts and employing the plurality of intensity maps to obtain an output indicating the amplitude and phase of the wavefront being analyzed.

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Inventors:

Arieri, Joel
Wolf ring, shy
Shekel, ial

Application Number:

JP2012230209A

Publication Date:

July 02, 2014

Filing Date:

October 17, 2012

Export Citation:

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Assignee:

Aikos Vision Systems Namrose Fennaught Shap

International Classes:

G01J9/02; G01B9/02; G01B11/24; G01J9/00; G01M11/00; G11B7/005; G11B7/14; G01N21/95; G11B20/10

Domestic Patent References:

JP3128411A
JP1212304A
JP5281048A
JP63308524A
JP63184029A

Attorney, Agent or Firm:

Shinjiro Ono
Yasushi Kobayashi
Hiroyuki Tomita
Osamu Hoshino
Motoharu Nakanishi

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