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Patent Searching and Data


Title:
SPECIMEN ANALYTICAL SYSTEM
Document Type and Number:
Japanese Patent JPH10282111
Kind Code:
A
Abstract:

To provide an analytical system which is suitable for flexibly connecting a plurality of specimen analytical systems in response to a request from a user.

In a specimen analytical system, a plurality of analytical units 6 and 14 is arranged along a transportation line 3 and a sample rack 2 is successively transported to the units 6 and 14 or transported to either one of the units 6 and 14 for the analysis of a specimen held in the rack 2. The rack 2 is carried in the system through a rack inlet 53 and the carrying out of the system through a rack outlet 70 or 71. When the rack 2 is carried out of the system through one rack outlet 70 or 71, the other rack outlet 71 or 70 is closed with a blind cover.


Inventors:
Kai, Susumu
Oishi, Tadashi
Takahashi, Katsuaki
Mimaki, Hiroshi
Application Number:
JP1997000090763
Publication Date:
October 23, 1998
Filing Date:
April 09, 1997
Export Citation:
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Assignee:
HITACHI LTD
International Classes:
G01N35/02; G01N35/04; (IPC1-7): G01N35/02; G01N35/04
Attorney, Agent or Firm:
高田 幸彦 (外1名)