SPECIMEN EXAMINATION DEVICE

Japanese Patent JP3776377

B2

PROBLEM TO BE SOLVED: To provide a specimen examination device capable of rapidly and accurately analyzing a specimen.
SOLUTION: A plurality of daughter specimen vessels 6 housing specimens are held on a conveying rack 4 in a matrix form. The light irradiation parts 2, arranged above the daughter specimen vessels 6 emit examination lights downwardly and the examination lights incident on the specimens in the daughter specimen vessels 6 from above transmit through the specimens downwardly. Each of the examination lights passes through each of light transmissive holes 10 to be detected by each of the transmitted light detection parts, arranged under the conveying rack 4 and absorbance is calculated. The concentration of a substance to be examined in reference light path length is calculated from the absorbance. Further, the light path length of the transmitted light from the specimen, in each of the daughter specimen vessels 6 is calculated by a light path length determining means. The concentration data to the reference light path length is converted or corrected, on the basis of the calculated light path length to determine the actual concentration of the substance to be examined.

Masamitsu Sudo
Kyoyuki Yoshimura
Junna Kawanabe
Go Ono

JP2002145344A

May 17, 2006

December 15, 2000

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Aloka Co., Ltd.

G01N21/01; G01N33/48; G01N33/483; G01N33/72; G01N35/04; (IPC1-7): G01N21/01; G01N33/48; G01N33/483; G01N33/72; G01N35/04

JP9274041A
JP7280814A
JP57132038A
JP6010856U
JP2001503855A

WO1998011423A1

Kazuo Asahi
Tatsuya Masuda

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