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Title:
SPECTACLE FITTING PARAMETER MEASUREMENT SYSTEM AND SPECTACLE FITTING PARAMETER MEASUREMENT METHOD
Document Type and Number:
Japanese Patent JP2013142597
Kind Code:
A
Abstract:

To provide a spectacle fitting parameter measurement system and spectacle fitting parameter measurement method capable of performing measurement with excellent reproducibility.

The spectacle fitting parameter measurement system is a system that includes an infrared light source (120) and two cameras (110R and 110L), and that makes a subject (300) wear a measurement spectacle (200) having a pair of optical elements and a frame holding the optical elements to measure a spectacle fitting parameter of the subject. Each optical element of the measurement spectacle or the frame thereof has markers marked at at least three locations, and a position of the marker is detected by each camera to calculate a three-dimensional position of a plane of each optical element. Further, a three-dimensional position of an eyeball center is measured by detecting infrared light on an eyeball surface of the subject with each camera. The spectacle fitting parameter is calculated on the basis of the three-dimensional position of the plane of each optical element and the three-dimensional position of the eyeball center.


Inventors:
YAMARIKU YOSHIYUKI
KUNIGOME YUJI
Application Number:
JP2012002642A
Publication Date:
July 22, 2013
Filing Date:
January 11, 2012
Export Citation:
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Assignee:
NIKON CORP
International Classes:
G01B11/00; A61B3/113; G02C13/00
Domestic Patent References:
JP2003329541A2003-11-19
JP2010524011A2010-07-15
JPH02134130A1990-05-23
JP2001340300A2001-12-11
JP2008513070A2008-05-01
Attorney, Agent or Firm:
Nobukazu Ito