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Title:
SPECTACLE WEARING IMAGE ANALYSIS DEVICE, SPECTACLE WEARING IMAGE ANALYSIS METHOD, AND SPECTACLE WEARING IMAGE ANALYSIS PROGRAM
Document Type and Number:
Japanese Patent JP2015143960
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To suitably calculate a spectacles wearing parameter.SOLUTION: A spectacles wearing image analysis device for analyzing an image of a subject wearing spectacles and measuring a spectacles wearing parameter of the subject includes: image acquisition means which acquires a first image shot in which a first state of the subject is photographed and a second image shot in which a second state different from the first state of the subject is photographed; and analysis means which acquires a first spectacles wearing parameter by analyzing the first image shot and acquires a second spectacle wearing parameter by analyzing the second image shot based on the first spectacles wearing parameter.

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Inventors:
ARIKAWA TORU
OZAKI YOSHIHIRO
Application Number:
JP2014017537A
Publication Date:
August 06, 2015
Filing Date:
January 31, 2014
Export Citation:
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Assignee:
NIDEK KK
International Classes:
G06T1/00; G02C13/00
Domestic Patent References:
JP2000020580A2000-01-21
JP2007003923A2007-01-11
JP2007093636A2007-04-12
JP2003329541A2003-11-19



 
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