Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
分光偏光計測装置
Document Type and Number:
Japanese Patent JP5140789
Kind Code:
B2
More Like This:
WO/2019/097939SPECTRAL ANALYSIS DEVICE AND SPECTRAL ANALYSIS METHOD
JPS62254020SPECTRUM ANALYSIS AND OPTICAL FIBER DEVICE AND METHOD FOR FILTER
WO/2014/102792OPTICAL METHOD AND SYSTEM FOR CRITICAL DIMENSIONS AND THICKNESS CHARACTERIZATION
Inventors:
Hiroshi Okabe
Masayuki Hayakawa
Kazuhiko Oka
Atsushi Taniguchi
Application Number:
JP2007167474A
Publication Date:
February 13, 2013
Filing Date:
June 26, 2007
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
OMRON Corporation
National University Corporation Hokkaido University
International Classes:
G01J3/447; G01J4/04
Domestic Patent References:
JP2006226984A
JP2006308550A
Other References:
Oka K, Kato T,Spectroscopic polarimetry with a channeled spectrum,OPTICS LETTERS,1999年11月 1日,Vol. 24, No. 21,pp.1475-1477
Sabatke D, et.al.,Snapshot imaging spectropolarimeter,Optical Engineering,2002年 5月,Vol.41, No.5,pp.1048-1054
Attorney, Agent or Firm:
Shinichi Iizuka



 
Previous Patent: JPS5140788

Next Patent: タイヤ電子管理システム