SPECTROMETER, SPECTROMETRY, AND SPECTROMETRIC PROGRAM

Japanese Patent JP2010151632

A

To provide a spectrometer, a spectrometry, and a spectrometric program capable of reducing an effect of a stray light occurring in the spectrometer.

The spectrometer 1A includes an integrating sphere 20 internally containing a sample S, a spectroscopic analyzer 30 dispersing a measurement object light from the sample S to acquire a wavelength spectrum, and a data analyzer 50. The analyzer 50, comprising an object domain setting section for setting a first object domain corresponding to an excitation light in the wavelength spectrum and a second object domain corresponding to luminescence from the sample S; and a sample information analyzing section for calculating a luminescent quantum yield of the sample S; calculates a measurement value Φ0of the luminescent quantum yield from results of reference and sample measurements, and using coefficients β and γ associated with the stray light in the reference measurement, calculates an analysis value Φ of the luminescent quantum yield less affected by the stray light, by a formula of Φ=βΦ0+γ.

COPYRIGHT: (C)2010,JPO&INPIT

WATANABE MOTOYUKI
IGUCHI KAZUYA
SUZUKI KENGO

JP2008330349A

July 08, 2010

December 25, 2008

Click for automatic bibliography generation  

HAMAMATSU PHOTONICS KK

G01N21/63; G01J3/443; G01N21/64

JP2008518222A	2008-05-29
JPH09292281A	1997-11-11
JP2006292511A	2006-10-26
JP2008070172A	2008-03-27
JP2003215041A	2003-07-30
JPH1073486A	1998-03-17
JPH1130552A	1999-02-02
JPH0572039A	1993-03-23
JP2004309323A	2004-11-04

Yoshiki Hasegawa
Shiro Terasaki
Satoru Ishida

Previous Patent: ACCELERATION SENSOR ELEMENT, ACCELERATION SENSOR DEVICE, AND METHOD OF MANUFACTURING THE ACCELERATIO...

Next Patent: SYSTEM AND METHOD FOR MEASURING SEISMIC WAVE