Title:
SPECTROSCOPIC ANALYSIS METHOD
Document Type and Number:
Japanese Patent JPS59168345
Kind Code:
A
Abstract:
A spectroanalytical method includes the steps of exciting material to spectroemissive levels, dispersing radiation from the excited sample material into a spectrum, positionally locating a reference constituent of the excited material in the spectrum, the reference constituent having a known wavelength offset from an element of interest in the sample material to be analyzed, and then shifting the known wavelength offset by an essentially hysteresis free mechanism and making an analytical measurement at that wavelength offset position of radiation produced by a spectrum from sample material that has been excited to spectroemissive levels.
Inventors:
SUTANREE BII SUMISU JIYUNIAA
ROBAATO JII SHIYURIICHIYAA
JIYON ENU UOOTAAMAN
ROBAATO JII SHIYURIICHIYAA
JIYON ENU UOOTAAMAN
Application Number:
JP4479584A
Publication Date:
September 22, 1984
Filing Date:
March 08, 1984
Export Citation:
Assignee:
ALLIED CHEM
International Classes:
G01J3/32; G01N21/73; G01J3/28; (IPC1-7): G01N21/73
Attorney, Agent or Firm:
Kyozo Yuasa