Title:
分光測定装置及び分光測定方法
Document Type and Number:
Japanese Patent JP7283190
Kind Code:
B2
Abstract:
To prevent the accuracy of measurement from being reduced due to the optical characteristics of an object in the composition of a multichannel type Fourier transform spectrometer.SOLUTION: Light from an object S irradiated with light from a light source 1 is interfered on a light receiving plane of an array optical receiver 2 by an interference optical system 3, and an output signal from the array optical receiver 2 having received interference light is processed by computation means 4 to calculate a spectrum. The interference optical system 3 is a Koehler illumination optical system for Koehler-illuminating the light receiving plane of the array optical receiver 2 with light from the object S, bifurcating the light by a Savart plate 31 as a separating element and superimposing two rays of light on the light receiving plane by a Fourier transform lens 32 as a multiplexing element.SELECTED DRAWING: Figure 1
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Inventors:
Katsuya Watanabe
Hideyuki Sera
Hideyuki Sera
Application Number:
JP2019072488A
Publication Date:
May 30, 2023
Filing Date:
April 05, 2019
Export Citation:
Assignee:
Ushio Inc.
International Classes:
G01J3/45
Domestic Patent References:
| JP2017156310A | ||||
| JP2015194359A | ||||
| JP2017125834A | ||||
| JP2003516522A | ||||
| JP7027613A | ||||
| JP2013002951A |
Foreign References:
| WO2015087370A1 |
Attorney, Agent or Firm:
Koichi Hotate