Title:
SPRING PROBE ASSEMBLY BODY
Document Type and Number:
Japanese Patent JP2978142
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To decrease the swing of a chip, increase the stiffness of a plunger, and extend the durable years of a probe by reducing the number of components such as a barrel and reducing a total indicator reading TIR.
SOLUTION: A test probe 10 has a chip 12 at one edge part of a hollow probe plunger 14. The plunger 14 is mounted in a socket 16 so that the chip 12 is extended in axial direction from the socket 16 and can contact an electrical device. The entire hollow plunger 14 has a tubular or circular section with a nearly uniform diameter and forms a long passage of a spring 18. Since the TIR of the spring probe decreases, the bearing length between the plunger 14 and the socket 16 increases, thus minimizing the swing of the probe chip 12 in the socket 16. Since the reduction in TIR can increase the diameter and the length as compared with the conventional spring probe, a probe with a large stiffness can be achieved. Also, by reducing the number of barrel elements, manufacturing and assembly costs can be reduced.
Inventors:
MAAKU EE SUWAATO
GOODON EE BINTAA
BAIRON SHII SANDAASON
CHAARUZU JEI JONSUTON
GOODON EE BINTAA
BAIRON SHII SANDAASON
CHAARUZU JEI JONSUTON
Application Number:
JP2076098A
Publication Date:
November 15, 1999
Filing Date:
February 02, 1998
Export Citation:
Assignee:
EBERETSUTO CHAARUZU TEKUNOROJIIZU INC
International Classes:
G01R1/067; G01R31/28; (IPC1-7): G01R1/067; G01R31/28
Domestic Patent References:
| JP10253660A | ||||
| JP518164U |
Attorney, Agent or Firm:
Takashi Ishida (3 others)