Title:
Standard calibration for an adaptive optics system
Document Type and Number:
Japanese Patent JP6225112
Kind Code:
B2
Abstract:
A method of determining a reference calibration setting for an adaptive optics system (1) comprising a detecting device (8) for detecting light from an object (5); and at least one controllable wavefront modifying device (9) arranged such that light from the object (5) passes via the wavefront modifying device (9) to the detecting device (8). The method comprises the steps of: arranging (100) a light-source between the object (5) and the wavefront modifying device (9) to provide a reference light beam to the detecting device (8) via the wavefront modifying device; for each of a plurality of orthogonal wavefront modes of the wavefront modifying device: controlling (101) the wavefront modifying device to vary a magnitude of the orthogonal wavefront mode over a predetermined number of magnitude settings; acquiring (102) a series of readings of the detecting device, each reading corresponding to one of the magnitude settings; determining (103) a quality metric value indicative of an information content of the reading for each reading in the series of readings, resulting in a series of quality metric values; and determining (106) a reference parameter set for the wavefront modifying device corresponding to an optimum quality metric value based on the series of quality metric values.
Inventors:
KNUTSSON, Per
Application Number:
JP2014533893A
Publication Date:
November 01, 2017
Filing Date:
October 04, 2012
Export Citation:
Assignee:
POPOVIC, Zoran
THAUNG, Jorgen
OWNER-PETERSEN, Mette
SVENSSON, Bengt
KNUTSSON, Per
THAUNG, Jorgen
OWNER-PETERSEN, Mette
SVENSSON, Bengt
KNUTSSON, Per
International Classes:
G01N21/27; G01J9/00; G01M11/02
Domestic Patent References:
| JP2003532150A | ||||
| JP2007527526A |
Foreign References:
| US20040156015 | ||||
| US20080259273 | ||||
| US20080284979 | ||||
| US20070176077 |
Attorney, Agent or Firm:
Satoshi Nazuka
Mitsuru Inoue
Mitsuru Inoue