Title:
インピーダンス測定のための標準試料
Document Type and Number:
Japanese Patent JP7240669
Kind Code:
B2
Abstract:
To provide a standard sample for impedance measurement.SOLUTION: A standard sample 51 for impedance measurement comprises a substrate B, a first electrode T1 and a second electrode T2 formed on main surfaces Ba and Bb of the substrate B, and at least one of elements D1 to D4 embedded in the substrate B. The elements D1 to D4 are connected between the first electrode T1 and the second electrode T2 to form a standard impedance circuit. The substrate B has a through hole H for accommodating the elements D1 to D4, and the elements D1 to D4 are embedded in the through hole H. On a side wall 75 of the through hole H, conductor films M1, M2 respectively connected to the first and second electrodes T1, T2 are formed. The terminals of the elements D1 to D4 are connected to the conductor films M1, M2 by solders 85, 86. The solders 85, 86 are arranged in the through hole H in a manner not to protrude from the electrodes T1, T2.SELECTED DRAWING: Figure 4
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Inventors:
Minoru Nakajima
Norio Yamamoto
Norio Yamamoto
Application Number:
JP2019115722A
Publication Date:
March 16, 2023
Filing Date:
June 21, 2019
Export Citation:
Assignee:
Quortec Co., Ltd.
Shiga Prefecture
Shiga Prefecture
International Classes:
G01R27/02
Domestic Patent References:
| JP2002148323A | ||||
| JP201749148A | ||||
| JP3207998U | ||||
| JP2015206673A | ||||
| JP1250870A |
Foreign References:
| US20150168531 |
Other References:
中島稔;山本典央;平野真,「2F01 固体電解質に適した交流インピーダンス測定治具および測定システムの開発」,第56回電池討論会講演要旨集,(公社)電気化学会 電池技術委員会,2015年11月10日,p.426
中島稔;山本典央;平野真,「固体電解質に適した交流インピーダンス測定治具および測定システムの開発」,株式会社クオルテック,2015年11月12日,http://web.archive.org/web/20160803004232/http://www.qualtec.co.jp/case/%E9%9B%BB%E6%B1%A0%E8%A8%8E%E8%AB%96%E4%BC%9A20151112_HP%E6%8E%B2%E8%BC%89%E7%94%A8.pdf
中島稔;山本典央,「固体電解質のインピーダンス測定に及ぼす要因」,株式会社クオルテック,2019年11月15日,http://web.archive.org/web/20220727084936/https://www.qualtec.co.jp/new_qualtec/wp-content/uploads/2021/10/Impedancemeasurement_HP.pdf
中島稔;山本典央;平野真,「固体電解質に適した交流インピーダンス測定治具および測定システムの開発」,株式会社クオルテック,2015年11月12日,http://web.archive.org/web/20160803004232/http://www.qualtec.co.jp/case/%E9%9B%BB%E6%B1%A0%E8%A8%8E%E8%AB%96%E4%BC%9A20151112_HP%E6%8E%B2%E8%BC%89%E7%94%A8.pdf
中島稔;山本典央,「固体電解質のインピーダンス測定に及ぼす要因」,株式会社クオルテック,2019年11月15日,http://web.archive.org/web/20220727084936/https://www.qualtec.co.jp/new_qualtec/wp-content/uploads/2021/10/Impedancemeasurement_HP.pdf
Attorney, Agent or Firm:
Patent Attorney Corporation Ai Patent Office