State monitor - 株式会社日立製作所

Title:

State monitor

Document Type and Number:

Japanese Patent JP6060261

Kind Code:

B2

Abstract:

The present invention relates to a condition monitoring apparatus for monitoring a machine condition. According to the present invention, the diagnosis accuracy can be improved as reducing dependence on technical knowledge about the machine. The condition monitoring apparatus that diagnosis an abnormal state of a machine based on machine operation data acquired from a plurality of sensors. The condition monitoring apparatus includes a data collection unit configured to collect a plurality pieces of sensor data of the machine, a diagnosing unit configured to acquire a sensor data group at a predetermined time from the sensor data and a data storage unit that stores a diagnostic model that is a requirement to diagnose an abnormal state of the machine, and diagnose the abnormal state of the diagnosed machine based on the diagnostic model, a first distribution creation unit configured to create first distribution that is data frequency of each sensor based on the sensor data group aggregated with the total number of bins or a width which is previously set according to the machine performance, a second distribution creation unit configured to extract sensor data from the sensor data group at a time when the diagnosing unit diagnoses the abnormal state and create second distribution that is frequency of extracted data of each sensor aggregated with the total number of bins or width which is same as that of the first distribution, a display unit configured to display, on a screen, the first distribution and the second distribution of each sensor, an input unit to which a user inputs a new diagnostic model, and an update unit configured to write the new diagnostic model to the data storage unit.

Inventors:

Tomoaki Hikita
Hideaki Suzuki
Junsuke Fujiwara
Takayuki Uchida

Application Number:

JP2015523670A

Publication Date:

January 11, 2017

Filing Date:

June 24, 2013

Export Citation:

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