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Title:
STRAIGHTNESS MEASUREMENT METHOD AND DEVICE
Document Type and Number:
Japanese Patent JP2010019742
Kind Code:
A
Abstract:

To provide a technique easily and precisely measuring straightness of a stage moving in a prescribed direction while suppressing the costs for measurement.

The central position of a straight linear pattern 21 in an X axis direction at each point is measured when a pattern body 2 having the straight linear pattern 21 on its upper surface is moved in Y axis direction for each of the cases when the pattern body 2 is fixed at a first position POS1 of the stage 1 and when it is fixed at a second position POS2 shifted by a prescribed length parallel to the moving direction of the stage 1 (+Y direction). By obtaining the difference between the obtained measurement results D1, D2, the displacement amount of the pattern 21 itself in the X axis direction is canceled out, and the amount of variation of the position of the stage 1 during movement at each position in the X axis direction is calculated. Further, by cumulatively adding the differential results, the displacement amount (movement errors, straightness) at each position in the X axis direction of the stage 1 moving in the (+Y) direction is calculated.


Inventors:
SHIBAZAKI HIROSHI
Application Number:
JP2008181675A
Publication Date:
January 28, 2010
Filing Date:
July 11, 2008
Export Citation:
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Assignee:
DAINIPPON SCREEN MFG
International Classes:
G01B11/30
Attorney, Agent or Firm:
Yoshitake Hidetoshi
Takahiro Arita



 
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