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Title:
STRIKING DEVICE FOR HAMMERING TEST WITH MARKING FUNCTION, HAMMERING TEST SYSTEM, AND MARKING METHOD
Document Type and Number:
Japanese Patent JP2016050801
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a striking device for hammering test with a marking function that enables, when the presence of any fault in an examination object is determined as a result of a hammering test, the persons concerned to identify a posteriori the struck position or positions so determined.SOLUTION: A striking device for hammering test with marking function 1000 has a striking unit 100 for striking an examination object and a marking unit 500 that can mark the position in the examination object struck by the striking unit 100.SELECTED DRAWING: Figure 1

Inventors:
YUASA FUMIO
Application Number:
JP2014175070A
Publication Date:
April 11, 2016
Filing Date:
August 29, 2014
Export Citation:
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Assignee:
FURUKAWA CO LTD
International Classes:
G01N29/12; E01D1/00; G01N29/24
Domestic Patent References:
JPH1114605A1999-01-22
JP2001249117A2001-09-14
JPH0474960A1992-03-10
JPH01104560U1989-07-14
JP2002295200A2002-10-09
Attorney, Agent or Firm:
Shinji Hayami