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Patent Searching and Data


Title:
Structure lighting viewing device
Document Type and Number:
Japanese Patent JP5939301
Kind Code:
B2
Abstract:
In order to reduce both the luminance irregularity inside a frame and the luminance irregularity between frames, an example of an observation device according to the present invention comprises an illumination optical system for illuminating a sample with laser light from a laser light source, and an imaging unit for repeatedly imaging the sample illuminated by the illumination optical system. The illumination optical system includes a light diffusion element and a control unit for periodically changing the diffusion pattern in the region of the light diffusion element onto which the laser light is irradiated. The control unit performs a setting so that the changes in the diffusion pattern during imaging operation match with each other among a plurality of the repeated imaging operations.

Inventors:
Yumiko Ouchi
Application Number:
JP2014528003A
Publication Date:
June 22, 2016
Filing Date:
July 31, 2013
Export Citation:
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Assignee:
NIKON CORPORATION
International Classes:
G02B21/06; G01N21/64
Domestic Patent References:
JP2013088808A2013-05-13
JP3107388U2005-02-03
JPH08233544A1996-09-13
JP2000275534A2000-10-06
JP2013088808A2013-05-13
JP2007233371A2007-09-13
Foreign References:
WO2008072597A12008-06-19
WO2009069675A12009-06-04
Attorney, Agent or Firm:
Furuya Fumio
Toshihide Mori