Title:
STRUCTURE QUALITY MEASUREMENT METHOD
Document Type and Number:
Japanese Patent JP2022014728
Kind Code:
A
Abstract:
To measure the quality of each layer of a structure constructed with a plurality of layers.SOLUTION: A structure quality measurement method for measuring the quality of a structure 10 constructed by curing a plurality of layers 11, 12 and 13 composed of a cement-based kneaded material includes: a step of collecting a core 20 including the plurality of layers 11, 12 and 13 from the structure 10; and a step of irradiating any layer of the plurality of layers 11, 12 and 13 included in the core 20 with radiation rays, and determining a density or an intensity of any layer of the plurality of layers 11, 12 and 13 on the basis of the transmitted transmission radiation dose.SELECTED DRAWING: Figure 4
Inventors:
KANBE TAKAYUKI
OI ATSUSHI
FUJITA YUSAKU
NASUNO KYONOBU
OI ATSUSHI
FUJITA YUSAKU
NASUNO KYONOBU
Application Number:
JP2020117246A
Publication Date:
January 20, 2022
Filing Date:
July 07, 2020
Export Citation:
Assignee:
KAJIMA CORP
International Classes:
E02B7/00; G01N23/06; G01N33/38
Domestic Patent References:
| JP2007277960A | 2007-10-25 | |||
| JP2001289840A | 2001-10-19 | |||
| JP2017008629A | 2017-01-12 | |||
| JP2011132761A | 2011-07-07 | |||
| JPH10227868A | 1998-08-25 | |||
| JPS63298141A | 1988-12-05 | |||
| JPH07504748A | 1995-05-25 |
Attorney, Agent or Firm:
Goto Patent Office
Previous Patent: Image sales system
Next Patent: Bad environment judgment device, bad environment judgment method
Next Patent: Bad environment judgment device, bad environment judgment method