Title:
SUBSTRATE APPEARANCE INSPECTION DEVICE, PRODUCTION LINE, AND SUBSTRATE APPEARANCE INSPECTION METHOD
Document Type and Number:
Japanese Patent JP2013172143
Kind Code:
A
Abstract:
To provide a substrate appearance inspection device which easily secures insulation quality between a given component attached to the substrate and a solder part disposed around the component, and to provide a production line and a substrate appearance inspection method.
A substrate appearance inspection device 2 of this invention inspects a distance L1, L2 between a component 84a, 84b, 84c, 84d attached to a substrate 8 and a solder part 82a, 82b, 82c, 82d disposed around the component 84a, 84b, 84c, 84d on the substrate 8.
Inventors:
AMANO MASAFUMI
OIKE HIROSHI
OIKE HIROSHI
Application Number:
JP2012037343A
Publication Date:
September 02, 2013
Filing Date:
February 23, 2012
Export Citation:
Assignee:
FUJI MACHINE MFG
International Classes:
H05K3/34; H05K13/04
Domestic Patent References:
| JPH06160037A | 1994-06-07 | |||
| JPS61293658A | 1986-12-24 | |||
| JP2005172640A | 2005-06-30 | |||
| JP2007173855A | 2007-07-05 | |||
| JP2006017474A | 2006-01-19 | |||
| JP2006261478A | 2006-09-28 |
Attorney, Agent or Firm:
Tomoaki Higashiguchi
Shindo Motoko
Shindo Motoko