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Patent Searching and Data


Title:
SUBSTRATE INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP2008063130
Kind Code:
A
Abstract:

To prevent a substrate from being deformed even if a conveying passage is long and convey the substrate with an excellent accuracy in a substrate inspection device.

This substrate inspection device comprises floating stages 1A, 2A, 3A for conveying a sheet-like substrate 4 as a subject and sucking and conveying parts 5, 6, 7 disposed on the sides of the floating stages in one of the directions crossing each other in the conveying direction, holding the end of the substrate 4, and imparting a conveying force to the substrate 4. The substrate 4 is conveyed by sequentially delivering the substrate 4 between the sucking and conveying parts.


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Inventors:
Fujimori, Hiroshi
Application Number:
JP2006000245739
Publication Date:
March 21, 2008
Filing Date:
September 11, 2006
Export Citation:
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Assignee:
OLYMPUS CORP
International Classes:
B65G35/00; G02F1/13; B65G35/00; G02F1/13