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Title:
SUPER-RESOLUTION MICROSCOPE AND MICROSCOPIC OBSERVATION METHOD
Document Type and Number:
Japanese Patent JP2014006450
Kind Code:
A
Abstract:

To provide a super-resolution microscope capable of observing a super-resolution image in high definition with high reliability.

A super-resolution microscope for observing a sample S including a substance having at least two excited quantum states includes: a first optical system radiating activation light and non-activation light on the sample S; a second optical system for condensation of pump light and erasing light to the sample S by partially superposing spacially; a scanning section 36 for scanning the sample S by the erasing light and the pump light; a detector 55 for detecting light emission from the sample S; and an arithmetic control section 56 for controlling radiation of the activation light, non-activation light, pump light, and erasing light to the sample S and scanning by the scanning section 36 and generating the light emission image of the sample S on the basis of the detection signal from the detector 55. The arithmetic control section 56 generates a light emission image of the sample S on the basis of the detection signal from the detector 55 in respective scanning points when the erasing light and the pump light are scanned after radiating activation light and non-activation light sequentially.


Inventors:
IKETAKI YOSHINORI
Application Number:
JP2012143499A
Publication Date:
January 16, 2014
Filing Date:
June 26, 2012
Export Citation:
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Assignee:
OLYMPUS CORP
International Classes:
G02B21/08; G01N21/64
Attorney, Agent or Firm:
Kenji Sugimura
Groundwork Kenichi