Title:
SUPERCONDUCTION PHASE DIFFERENCE DETECTION
Document Type and Number:
Japanese Patent JPS6437882
Kind Code:
A
Abstract:
PURPOSE:To detect the phase difference of superconductive currents between two points by obtaining magnetic flux generated around a superconductor from phase difference acquired by making reference electron beams emitted from an electron beam source and reflected electron beams from the superconductor to interfere. CONSTITUTION:A vacuum chamber 1 is cooled by liquid HE 2, and a superconductor 4 is cooled by liquid He and superconductive currents I are flowed. Reference electron beams projected to a photographic plate 7 through a path 2 (a balloon) from an electron source 3 and electrons projected to the superconductor 4 through a path 1 (a balloon), reflected and projected to the photographic plate 7 through a path 1 (a balloon) at a distance equal to the path 2 (the balloon) interfere, and an interference fringe is generated. Secondary electrons generated from the superconductor 4 at that time are removed by a DC electric field applied to plates 8, 9. Magnetic flux is obtained from the phase difference of the interference fringe generated by the presence or absence of the magnetic flux of electron beams passing on both sides of magnetic flux 6, and the phase difference of superconductive currents between two points is acquired from the value of magnetic flux.
Inventors:
YOSHIDA AKIRA
TAMURA YASUTAKA
TAMURA YASUTAKA
Application Number:
JP19397187A
Publication Date:
February 08, 1989
Filing Date:
August 03, 1987
Export Citation:
Assignee:
FUJITSU LTD
International Classes:
G01R31/00; G01R25/00; H01L39/00; (IPC1-7): G01R25/00; G01R31/00; H01L39/00
Attorney, Agent or Firm:
Sadaichi Igita