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Patent Searching and Data


Title:
SURFACE ANALYZER THROUGH PULSE
Document Type and Number:
Japanese Patent JPS6264035
Kind Code:
A
Abstract:

PURPOSE: To enable measurement at the scattering angle of about 180° by providing a deflection magnet and a deceleration tube while a deflection electrode for correcting the trajectory of scattering beam between the deflection magnet and the deceleration tube.

CONSTITUTION: A deflection magnet 30 comprising an electromagnet is arranged in front of a scattering chamber 14 while the acceleration system of ion beam 3 and the measuring system of scattering beam 3' are arranged such that said deflection magnet 30 will be at the top of a triangle. Since the deflection magnet 30 will deflect the ion beam 3 to be irradiated onto a sample 15 and the scattering beam 3' from the sample 15 in the opposite directions, the scattering angle can be set approximately 180°. Although the trajectory of deflected scattering beam 3' is different with correspondence to the surface composition of the sample 15, it can be corrected through a deflection electrode 40.


Inventors:
ITO KENSHO
MORITA KENJI
MATSUNAMI NORIAKI
MATSUDA KOJI
AOKI MASAHIKO
Application Number:
JP20259185A
Publication Date:
March 20, 1987
Filing Date:
September 13, 1985
Export Citation:
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Assignee:
UNIV NAGOYA
NISSIN ELECTRIC CO LTD
International Classes:
G01N23/203; H01J37/252; H01J49/06; (IPC1-7): G01N23/203; H01J37/252; H01J49/06
Attorney, Agent or Firm:
Keiji Yamamoto