SURFACE DEFECT INSPECTING DEVICE

Japanese Patent JP3185559

B2

PURPOSE: To closely measure the surface defect of an object to be inspected by providing an image pickup means which converts a received light image into image data, boundary area discriminating means which discriminates the boundary area of bright and dark areas in low-frequency areas in the image data, image emphasizing means, defect detecting means, etc.
CONSTITUTION: An illuminator 1 is positioned so that a surface 3 to be inspected can be irradiated with light in a prescribed bright-and-dark pattern. A camera unit 4 generates the image signal of the received light image picked up with a video camera 2 and outputs the image signal to an image processor 5. The processor performs a boundary area discriminating process, image process, and defect detecting process on the original image. In order to discriminates the boundary areas of stripes from the original image, the stripe lighting interval, width, and brightness-to-darkness ratio are set so that the magnitude differences among three components of shading, stripe lighting, and luminance changing components can become larger. In the image emphasizing process, a subtracting process and absolute value process are performed. In the defect detecting process, subtracted results are binarized after boundary area discriminated results are subtracted from image emphasized results.

JP2022012897	IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND PROGRAM
JP3405220	INSPECTION DEVICE FOR CYLINDRICAL OBJECT

Masanori Imanishi
Honami Syoyo
Chinori Nousou

JP22057894A

July 11, 2001

September 14, 1994

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Nissan Motor Co., Ltd

G01B11/30; G01N21/88; (IPC1-7): G01B11/30; G01N21/88

JP63111448A
JP6148098A
JP416752A
JP2298841A
JP6235624A
JP5164703A
JP63171345A
JP293313A

Junnosuke Nakamura (1 outside)

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